Randomized benchmarking of quantum gates, E. Knill, D. Leibfried, R. Reichle, J. Britton, R. B. Blakestad, J. D. Jost, C. Langer, R. Ozeri, S. Seidelin, and D. J. Wineland, 2008Physical Review A, Vol. 77 (American Physical Society)DOI: 10.1103/PhysRevA.77.012307 - 一篇介绍随机基准测试的奠基性论文,这是一种用于评估量子门平均保真度的可扩展协议,对表征硬件性能至关重要。