The Unreasonable Effectiveness of Deep Features as a Perceptual Metric, Richard Zhang, Phillip Isola, Alexei A. Efros, Eli Shechtman, Oliver Wang, 2018Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)DOI: 10.48550/arXiv.1801.03924 - Presents the Learned Perceptual Image Patch Similarity (LPIPS) metric, which is commonly used as the perceptual distance function in PPL calculations.